Portable Low-Cost Measurement Setup for 2D Imaging of Organic Semiconductors

被引：0

作者：

Celuch, Malgorzata ^{[1
]}

Douheret, Olivier ^{[2
]}

Korpas, Przemyslaw ^{[1
,3
]}

Michnowski, Ryszard ^{[1
,4
]}

Olszewska-Placha, Marzena ^{[1
]}

Rudnicki, Janusz ^{[1
]}

机构：

[1] QWED Sp Zoo, Warsaw, Poland

[2] Mat Nova, Mons, Belgium

[3] Warsaw Univ Technol, Inst Radioelect & Multimedia Technol, Warsaw, Poland

[4] Vigo Syst SA, Ozarow Mazowiecki, Poland

来源：

PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) | 2020年

基金：

欧盟地平线“2020”;

关键词：

material measurements; portable test-fixtures; non-destructive testing; dielectric resonators; 2D imaging; network analyzer; organic semiconductors; permittivity; dielectric loss; Gwyddion format; RESISTIVITY; POST; INK;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A portable test-fixture for the imaging of discontinuities in novel materials, such as organic semiconductors, is designed, manufactured, and validated. A 10 GHz split-post dielectric resonator (SPDR) compliant with the IEC norm is used as a microwave probe. It is built into a custom-made 2D shift-shift scanner, providing non-destructive microwave-transparent support for the sample-under-test. Microwave signal generation and measurements are performed by a new dedicated scalar network analyzer, called Q-Meter. The setup is controlled by Windows application, which allows also connecting to professional VNAs. Verification of the portable scanner is provided with respect to stand-alone SPDR and laboratory VNA. It is then applied to a PEDOT sample of current interest in organic electronics.

引用

页码：373 / 376

页数：4

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