Adsorption and manipulation of carbon onions on highly oriented pyrolytic graphite studied with atomic force microscopy

被引：7
|
作者：
Zhou, Jianfeng
Shen, Ziyong [1 ]
Hou, Shimin
Zhao, Xingyu
Xue, Zengquan
Shi, Zujin
Gu, Zhennan
机构：
[1] Peking Univ, Dept Elect, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
[2] Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China
来源：
APPLIED SURFACE SCIENCE | 2007年 / 253卷 / 06期
基金：
中国国家自然科学基金;
关键词：
atomic force microscopy (AFM); carbon onions; adsorption properties; nano-scale manipulation;
D O I：
10.1016/j.apsusc.2006.07.012
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Carbon onions produced by DC arc discharge method were deposited on highly oriented pyrolytic graphite (HOPG) surface and their adsorption and manipulation was studied using an atomic force microscopy (AFM). Well-dispersed adsorption of carbon onions on HOPG surface was obtained and aggregations of onions were not observed. The van der Waals interaction between the onion and HOPG surface and that between two onions, were calculated and discussed using Hamaker's theory. The manipulation of adsorbed onions on HOPG surface was realized using the AFM in both the raster mode and the vector mode. The controllability and precision of two manipulation modes were compared and the vector mode manipulation was found superior, and is a useful technique for the construction of nano-scale devices based on carbon onions. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：3237 / 3241
页数：5
相关论文
共 50 条
  • [1] The adsorption of n-hexadecane onto highly oriented pyrolytic graphite studied by atomic force microscopy
    Martin, DS
    Weightman, P
    Gauntlett, JT
    [J]. SURFACE SCIENCE, 1998, 398 (03) : 308 - 317
  • [2] Anion intercalation into highly oriented pyrolytic graphite studied by electrochemical atomic force microscopy
    Alliata, D
    Häring, P
    Haas, O
    Kötz, R
    Siegenthaler, H
    [J]. ELECTROCHEMISTRY COMMUNICATIONS, 1999, 1 (01) : 5 - 9
  • [3] The adsorption of n-dodecane and n-pentane onto highly oriented pyrolytic graphite studied by atomic force microscopy
    Martin, DS
    Weightman, P
    Gauntlett, JT
    [J]. SURFACE SCIENCE, 1999, 424 (2-3) : 187 - 198
  • [4] The adsorption of an n-hexadecane/benzoic acid solution onto highly oriented pyrolytic graphite studied by atomic force microscopy
    Martin, DS
    Weightman, P
    Gauntlett, JT
    [J]. SURFACE SCIENCE, 1999, 431 (1-3) : 138 - 145
  • [5] The evaporation of n-hexadecane from highly oriented pyrolytic graphite studied by atomic force microscopy
    Martin, DS
    Weightman, P
    Gauntlett, JT
    [J]. SURFACE SCIENCE, 1998, 417 (2-3) : 390 - 405
  • [6] Atomic force microscopy of platinum nanoparticles prepared on highly oriented pyrolytic graphite
    Lee, I
    Chan, KY
    Phillips, DL
    [J]. ULTRAMICROSCOPY, 1998, 75 (02) : 69 - 76
  • [7] Self-assembled polyphenylene dendrimer nanofibers on highly oriented pyrolytic graphite studied by atomic force microscopy
    Liu, DJ
    De Feyter, S
    Grim, PCM
    Vosch, T
    Grebel-Koehler, D
    Wiesler, UM
    Berresheim, AJ
    Müllen, K
    De Schryver, FC
    [J]. LANGMUIR, 2002, 18 (21) : 8223 - 8230
  • [8] Unusual DNA Structures Formed on Bare Highly Oriented Pyrolytic Graphite Surfaces Studied by Atomic Force Microscopy
    Liu, Zhiguo
    Zhao, Lin
    Zu, Yuangang
    Tan, Shengnan
    Wang, Yuanlin
    Zhang, Yiming
    [J]. MICROSCOPY AND MICROANALYSIS, 2013, 19 (03) : 544 - 552
  • [9] Adsorption of Human Serum Albumin Onto Highly Orientated Pyrolytic Graphite Surface Studied by Atomic Force Microscopy
    Peng, Xiao
    Fu, Haoran
    Liu, Ruisi
    Zhao, Lin
    Zu, Yuangang
    Xu, Fengjie
    Liu, Zhiguo
    [J]. SCANNING, 2015, 37 (02) : 158 - 164
  • [10] Scanning tunneling microscopy and atomic force microscopy of Au implanted in highly oriented pyrolytic graphite
    Tung, YS
    Ueda, A
    Henderson, DO
    Mu, R
    Gu, Z
    White, CW
    Zuhr, RA
    Zhu, JG
    [J]. ION-SOLID INTERACTIONS FOR MATERIALS MODIFICATION AND PROCESSING, 1996, 396 : 233 - 238
12345