The electron-beam charging of a target on the rising section of the secondary-emission characteristic

被引：0
|
作者：
Kirpichenko, YR [1 ]
机构：
[1] Tomsk State Univ Control Syst & Radio Elect, Tomsk, Russia
来源：
JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS | 2000年 / 45卷 / 05期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The electron-beam charging of a camera tube target on the rising section of the secondary-emission characteristic (SEC) is considered when it is performed in the multiple-frame accumulation mode in order to compensate the background potential.
引用
收藏
页码：557 / 561
页数：5
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