Inverse Profiling for Microwave Diagnostics of ECR Ion Source Plasma

Electron cyclotron resonance (ECR) plasma diagnostics is one of the main challenging research activity in plasma physics due to the extraordinary possibility to gain information about the heating and fusion process both in small size and large size reactors. Among the other possibilities, microwave imaging offer an interesting way to retrieve the shape and the electron density/collision rate distribution. With reference to such a scenario, we address the problem of reconstructing one dimensional plasma dielectric profiles via inverse scattering technique, processing multi-frequency reflected field data gathered under a simple wide frequency setup.