Drift-diffusion modeling of photocurrent transients in bulk heterojunction solar cells

被引:138
|
作者
Hwang, Inchan [1 ]
McNeill, Christopher R. [1 ]
Greenham, Neil C. [1 ]
机构
[1] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
基金
英国工程与自然科学研究理事会;
关键词
FIELD-ASSISTED DISSOCIATION; PHOTOVOLTAIC DEVICES; CHARGE INJECTION; POLYMER; TRANSPORT; FILMS;
D O I
10.1063/1.3247547
中图分类号
O59 [应用物理学];
学科分类号
摘要
We utilize a time-dependent. drift-diffusion model Incorporating electron trapping and field-dependent charge separation to explore the device physics of organic bulk-heterojunction solar cells based on blends of poly(3-hexylthiophene) (P3HT) With a red polyfluorene copolymer. The model IS used to reproduce experimental photocurrent transients measured in response to a step-function excitation of light of varied Intensity. The experimental photocurrent transients are characterized by (i) it fast rise of order 1 mu s followed by (it) it slow rise of order 10-100 mu s that evolves into a transient peak,it high intensity. (iii) it fast decay component after turn-off and (iv) a long-lived tail with magnitude that does not scale linearly with light intensity or steady-state photocurrent The fast rise and decay components are explained by the transport of mobile carriers while the slow rise and decay components are explained by slower electron trapping and detrapping processes The transient photocurrent peak at high intensities with Subsequent decay to the steady-state value is explained by trap-mediated space-charge effects The build-up of trapped electron in the device produces reduction in the strength of the electric field near the transparent anode that increases the likelihood of bimolecular recombination, and lowers the overall efficiency of charge dissociation in the device. Notably the model demonstrates that,I reduction in free charge generation rate by space-charge effects is its significant as biomolecular recombination in this device assuming Langevin-type bimolecular, as, recombination. The model is also used to explore the dynamics of char-e separation with all Upper bound of 50 its set for the lifetime of electron-hole pairs, and to provide an estimate of the trap density of 1 3 x 10(22) m(-3) (C) 2009 American Institute of Physics. [doi: 10.1063/1.3247547]
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页数:10
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