Optical full-field measurement of strain at a microscopic scale with the grid method

被引：1
|
作者：
Moulart, Raphael [1 ]
Rotinat, Rene [1 ]
Pierron, Fabrice [1 ]
Lerondel, Gilles [1 ]
Royer, Pascal [1 ]
机构：
[1] ENSAM, Lab Mecan & Procedes Fabricat, Rue St Dominique,BP 508,JE 2381, F-51006 Chalons Sur Marne, France
来源：
SPECKLE06: SPECKLES, FROM GRAINS TO FLOWERS | 2006年 / 6341卷
关键词：
full-field measurement; microscopic scale; grid method; optimization;
D O I：
10.1117/12.695991
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this work, a new micro-extensometric technique to study the local heterogeneities of strain fields in metallic alloys is introduced. It is based on the optical full-field measurement method called the grid method adapted to the micrometric scale. In the first part of the paper, the making of a periodic grating at the surface of the sample by direct interferometric photolithography is explained. The optimization of the grids in terms of phase noise is then addressed.
引用
收藏
页数：6
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