RHEED study of the (110) cleavage surface of CdTe:Cr single crystals

被引:6
|
作者
Sagan, P. [1 ]
Kuzma, M. [1 ]
机构
[1] Univ Rzeszow, Inst Phys, PL-35959 Rzeszow, Poland
关键词
diluted magnetic semiconductors; cadmium telluride; reflection high energy electron diffraction; surface structure; morphology; roughness and topography;
D O I
10.1016/j.susc.2006.12.022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structure of (110) plane of Cr-doped CdTe single crystals has been studied by reflection high energy electron diffraction and scanning electron microscopy. Diffraction patterns consist of diffraction spots and Kikuchi lines. However, for very small incident angle, the Debye rings are observed. The constant lattice attributed to these rings is 0.8% less then for pure CdTe. These anomalous properties of the near surface layer are likely to occur due to the concentration of Cr atoms creating compressive surface strains or the effect of crystal cleavage. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1212 / 1217
页数:6
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