Power spectral density method of defects on optical elements of high-power laser facility and its equivalent algorithm

被引：4

作者：

Zhou Li-Dan ^{[1
]}

Su Jing-Qin ^{[1
]}

Li Ping ^{[1
]}

Lu Lan-Qin ^{[1
]}

Wang Wen-Yi ^{[1
]}

Wang Fang ^{[1
]}

Mo Lei ^{[1
]}

Cheng Wen-Yong ^{[1
]}

Zhang Xiao-Min ^{[1
]}

机构：

[1] CAEP Mianyang, Res Ctr Laser Fus, Mianyang 621900, Peoples R China

来源：

ACTA PHYSICA SINICA | 2009年 / 58卷 / 09期

关键词：

power spectral density; statistical analysis; equivalent method; defects;

D O I：

10.7498/aps.58.6279

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The method of power spectral density (PSD) to describe defects existing on optical elements was proposed for the first time. An equivalent PSD algorithm was composed for treating the presence of plenty of amplitude-modulating micrometer-siged defects using statistical theory, and the method was validated by simulation.

引用

页码：6279 / 6284

页数：6

共 17 条

[1] ANDRE ML, 1996, SOLID STATE LASERS A, P38
[2] [Anonymous], UCRLID13812099
[3] BESPALOV VI, 1966, JETP LETT-USSR, V3, P307
[4] SMALL-SCALE SELF-FOCUSING EFFECTS IN A HIGH-POWER GLASS LASER-AMPLIFIER
FLECK, JA
MORRIS, JR
BLISS, ES
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1978, 14 (05) : 353 - 363
[5] HOT IMAGES FROM OBSCURATIONS
HUNT, JT
MANES, KR
RENARD, PA
[J]. APPLIED OPTICS, 1993, 32 (30): : 5973 - 5982
[6] *INT ORG STAND, 10110 ISO 8
[7] LAWSON JK, 1995, P SOC PHOTO-OPT INS, V2536, P38, DOI 10.1117/12.218430
[8] LAWSON JK, UCRLJC137699
[9] MOSES E, 2003, UCRLJC151593
[10] MURRAY J, 1997, UCRLLR105821973, P99

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