A Novel Method to Evaluate the RFID System Reliability

被引：1
|
作者：
Xie, Jiawen [1 ]
Wang, Minli [1 ]
Tan, Jie [1 ]
机构：
[1] Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
来源：
13TH GLOBAL CONGRESS ON MANUFACTURING AND MANAGEMENT | 2017年 / 174卷
关键词：
RFID system; data-driver; least squares; reliability; LINK BUDGETS; ENVIRONMENTS; RADIO;
D O I：
10.1016/j.proeng.2017.01.167
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The RFID system application environment may be different, this have huge influence to the RFID system reliability. This paper presents a data-driven model to evaluate the reliability of RFID systems by analyzing the factors that affect RFID system reliability. We construct free-space and semi-closed metal environment two scenarios by using the proposed model to determine the reliable reference parameter range in these scenarios. The experimental results show that the proposed model can evaluate the reliability of RFID system easily and quickly in different application scenarios. (C) 2017 The Authors. Published by Elsevier Ltd.
引用
收藏
页码：465 / 469
页数：5
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