X-ray photoelectron spectroscopy of ferroelectrics

被引：8
|
作者：
Grigas, Jonas
Talik, Ewa
Lazauskas, Valentinas
机构：
[1] Vilnius Univ, Fac Phys, LT-10222 Vilnius, Lithuania
[2] Silesian Univ, Inst Phys, PL-40007 Katowice, Poland
[3] Vilnius Univ, Inst Theoret Phys & Astron, LT-01108 Vilnius, Lithuania
来源：
FERROELECTRICS | 2007年 / 347卷
关键词：
electron structure; SbSeI; BiSI; XPS; binding energies; chemical schifts;
D O I：
10.1080/00150190601187237
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The paper presents the X-ray photoelectron spectra (XPS) of the valence band (VB) and of the principal core levels (CL) for SbSI-type and incommensurate TlInS2 single crystals. Form and electronic structure of the VB and CL splitting in the quasi-one-dimensional SbSI, SbSeI and BiSI, and in the incommensurate (IC) phase of TlInS2 crystals are discussed. Experimentally obtained energies were compared with the results of theoretical ab initio calculations. Large shifts (3 divided by 5 eV) in the CL binding energies in SbSI show a strong dependence on the surface crystallographic plane. The splitting of the CL was also obtained in the IC phase of TlInS2 crystals.
引用
收藏
页码：86 / 100
页数：15
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