Evaluation of medium voltage enameled wire exposed to fast repetitive voltage pulses

被引:21
|
作者
Haq, Saeed Ul [1 ]
Jayaram, Shesha H. [1 ]
Cherney, Edward A. [1 ]
机构
[1] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
fom-wound stator coils; inter-turn insulation; nano-filled enameled wires; partial discharge inception voltage; residual strength; space charge injection; charge trapping levels;
D O I
10.1109/TDEI.2007.302888
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper describes the investigation of the failure mechanisms of medium voltage inter-turn insulation, as a consequence of pulse aging. To study the performance and failure behaviour of enameled wires, models of inter-turn insulation are prepared with enameled wires having polyimide and nano-filled coatings. The aging of such bar samples is attained by si.nusoidal (60Hz), fast repetitive unipolar voltage pulses, and high frequency ac waveforms. To establish the residual strength of the bar samples, dc breakdown voltages are determined before and after the aging. In addition, the thermally stimulated depolarization current (TSDC) is used to provide information about the relaxation processes, such as the disorientation of the dipoles and the release of charges from the trapping sites in enameled wires. The various trapping levels, which have discrete energy differences with distinct peaks in the thermograms, are discussed in terms of space charge polarization.
引用
收藏
页码:194 / 203
页数:10
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