Electrical doping in halide perovskites

被引:216
|
作者
Euvrard, Julie [1 ]
Yan, Yanfa [2 ,3 ]
Mitzi, David B. [1 ,4 ]
机构
[1] Duke Univ, Dept Mech Engn & Mat Sci, Durham, NC 27706 USA
[2] Univ Toledo, Dept Phys & Astron, Toledo, OH USA
[3] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat, Toledo, OH USA
[4] Duke Univ, Dept Chem, Durham, NC 27706 USA
基金
美国国家科学基金会;
关键词
INTERFACIAL CHARGE-TRANSFER; MOTT-SCHOTTKY ANALYSIS; SINGLE-CRYSTALS; SOLAR-CELLS; P-TYPE; OPTOELECTRONIC PROPERTIES; HYBRID PEROVSKITES; INTRINSIC DEFECTS; CARRIER LIFETIME; TRANSPORT LAYER;
D O I
10.1038/s41578-021-00286-z
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Halide perovskites exhibit outstanding semiconductor properties and are a key component of a variety of devices, including solar cells and light-emitting diodes. This Review discusses electrical doping strategies for halide perovskites and takes a critical look at the challenges that need to be overcome to control the electronic properties of these semiconducting materials. Electrical doping (that is, intentional engineering of carrier density) underlies most energy-related and optoelectronic semiconductor technologies. However, for the intensely studied halide perovskite family of semiconductors, reliable doping remains challenging, owing to, for example, compensation from and facile migration of intrinsic defects. In this Review, we first discuss the underlying fundamentals of semiconductor doping and then investigate different doping strategies in halide perovskites, including intrinsic defect, extrinsic defect and charge transfer doping, from an experimental as well as a theoretical perspective. We outline the advantages and pitfalls of different characterization techniques to assess doping and examine the impact of doping on optoelectronic properties. Finally, we highlight challenges that need to be overcome to gain control over the electronic properties of this important material class.
引用
收藏
页码:531 / 549
页数:19
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