Advancements in Hard X-ray Multilayers for X-ray Astronomy

被引：14
|
作者：
Windt, David L. [1 ]
机构：
[1] Reflect Xray Opt LLC, New York, NY 10027 USA
来源：
OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VII | 2015年 / 9603卷
关键词：
Multilayers; Hard X-ray Astronomy; DESIGN; FILMS; COATINGS; SUPERMIRRORS; DEPOSITION; GROWTH;
D O I：
10.1117/12.2187481
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
This paper is focused on recent progress in the development of broad-band multilayer coatings designed for hard X-ray energies, for use in future astronomical telescopes. We describe a new laboratory-based hard X-ray reflectometer for at-wavelength characterization of multilayer films, we present the results of an experimental comparison of the hard X-ray performance of several W-based periodic multilayer coatings, and we describe the optimization and experimental performance of new non-periodic Co-based multilayer coatings (both depth-graded and aperiodic), designed for continuous response through the W and Pt K-edges near 70 and 80 keV, respectively. We discuss future research directions in light of these new results.
引用
收藏
页数：14
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