Experimental Study of Process Emissions From Atomic Layer Deposition of Al2O3 Under Various Temperatures and Purge Time

被引:3
|
作者
Ma, Lulu [1 ]
Pan, Dongqing [2 ]
Xie, Yuanyuan [1 ]
Wang, Fenfen [1 ]
Yuan, Chris [3 ]
机构
[1] Univ Wisconsin Milwaukee, Dept Mech Engn, Milwaukee, WI 53211 USA
[2] Univ North Alabama, Dept Engn Technol, Florence, AL 35632 USA
[3] Case Western Reserve Univ, Dept Mech & Aerosp Engn, Cleveland, OH 44106 USA
基金
美国国家科学基金会;
关键词
atomic layer deposition; nanoparticles; scanning mobility particle sizer spectrometer (SMPS); methane; temperature; purge time; SURFACE-CHEMISTRY; ALUMINUM-OXIDE; NANOPARTICLES; HEALTH; WATER; GAS; ALD; TRIMETHYLALUMINUM; PERFORMANCE; DYNAMICS;
D O I
10.1115/1.4035722
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Experimental investigations of process emissions,from atomic, layer deposition (ALD) of Al2O3, are accomplished under various temperatures and purge times to understand its environmental sustainability performance. About 93% of Trimethylaluminum (TMA) is found flowing through ALD system without deposition. 2-9 x 10(4) of ultrafine nanoparticles containing 51.9 +/- 4.6% of C, 16.6 +/- 0.9% of Al, 31.4 +/- 4.1% of O are generated during each cycle of reactions. 0.34-0.38 cm(3) of CH4 (25 degrees C, 1 atm), which takes up 45-51% of C contained in TMA is produced simultaneously. The concentration of nanoparticles drops with the increase of purge time. CH4 also has a trend of decreasing but acts more complex with the largest emission at a short purge time. Compared with temperature, which has limited effects on reactants, purge time changes the time of reaction as well as the degree of gas phase mixing, and therefore greatly influences ALD emissions.
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页数:7
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