Portable total reflection X-ray fluorescence spectrometer for nanogram Cr detection limit

被引：53
|
作者：
Kunimura, Shinsuke [1 ]
Kawai, Jun [1 ]
机构：
[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
来源：
ANALYTICAL CHEMISTRY | 2007年 / 79卷 / 06期
关键词：
D O I：
10.1021/ac062279t
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A portable total reflection X-ray fluorescence spectrometer is presented. The present spectrometer mainly consists of a 1.5-W X-ray tube, a waveguide type slit, a detector, and a sample carrier (a quartz optical flat), and these components are contained in an attache case-type box. Continuum X-rays emitted from the low-power X-ray tube are used for the excitation of the X-ray fluorescence, and the minimum detection limit for Cr is a few nanograms or the level of 10(13) atoms/cm(2).
引用
收藏
页码：2593 / 2595
页数：3
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