Principal components analysis of the photoresponse nonuniformity of a matrix detector

被引：11
|
作者：
Ferrero, Alejandro
Alda, Javier
Campos, Joaquin
Lopez-Alonso, Jose Manuel
Pons, Alicia
机构：
[1] CSIC, Inst Fis Aplicada, E-28006 Madrid, Spain
[2] Univ Complutense Madrid, Escuela Univ Opt, Grp Complutense Opt Aplicada, E-28040 Madrid, Spain
来源：
APPLIED OPTICS | 2007年 / 46卷 / 01期
关键词：
D O I：
10.1364/AO.46.000009
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The principal component analysis is used to identify and quantify spatial distributions of relative photoresponse as a function of the exposure time for a visible CCD array. The analysis shows a simple way to define an invariant photoresponse nonuniformity and compare it with the definition of this invariant pattern as the one obtained for long exposure times. Experimental data of radiant exposure from levels of irradiance obtained in a stable and well-controlled environment are used. (c) 2007 Optical Society of America.
引用
收藏
页码：9 / 17
页数：9
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