The formation and thermal stability of exchange bias in NiFe/PtMn bilayers

被引：3

作者：

Li Yan ^{[1
]}

Chen Qing-Yong ^{[1
]}

Jiang Hong-Wei ^{[1
]}

Wang Ai-Ling ^{[1
]}

Zheng Wu ^{[1
]}

机构：

[1] Capital Normal Univ, Dept Phys, Beijing 100037, Peoples R China

来源：

ACTA PHYSICA SINICA | 2006年 / 55卷 / 12期

关键词：

NiFe/PtMn bilayers; exchange bias; thermal stability;

D O I：

10.7498/aps.55.6647

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

(Ni0.81Fe0.19)(1-x) Cr-x/NiFe/PtMn films were prepared by magnetron sputtering. The formation and thermal stablitity of NiFe/PtMn bilayers were systematically investigated. The experiment shows that the grain size of PtMn layer depends strongly on the change in Cr concent ration. Thermal stability of exchange bias indicates that (Ni0.81Fe0.19)(1-x)Cr-x/NiFe/PtMn films with larger PtMn grains have a higher blocking temperature, and the bigger grain size is helpful in reducing the critical thickness of PtMn layer, which is consistent with Mauri's model.

引用

页码：6647 / 6650

页数：4

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