Scattering and Propagation Analysis for the Multilayered Structures Based on Field Matching Technique

A semi-analytical method is employed to the analysis of scattering and guiding problems in multilayer dielectric structures. The approach allows to investigate objects with arbitrary convex cross section and is based on the direct field matching technique involving the usage of the field projection at the boundary on a fixed set of orthogonal basis functions. For the scattering problems the scattered field in the far zone is calculated and for the guiding problems a complex root finding algorithm is utilized to determine the propagation coefficients. The results are compared with the alternative solutions in order to verify the validity of the proposed method.