Microstructural characterization of polycrystalline materials using a X-ray single-crystal diffractometer equipped with an area detector

被引：0

作者：

Rodriguez-Navarro, Alejandro B. ^{[1
]}

Alvarez-Lloret, Pedro ^{[1
]}

机构：

[1] Univ Granada, Dept Mineral & Petrol, Granada, Spain

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷

关键词：

microstructure; grain size; pole figures;

D O I：

10.1107/S0108767311083024

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS74.P03

引用

页码：C671 / C671

页数：1

共 50 条

[1] Registering pole figures using an X-ray single-crystal diffractometer equipped with an area detector
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