Magnetic properties and underlayer thickness in SmCo/Cr films

SmCo films with a Cr underlayer have been investigated as potentially attractive candidates for high density recording media. Magnetron sputtering was used here to produce Cr/SmCox/Cr films on Si (100) substrates. The magnetic films were deposited at a substrate temperature of 350 degrees C and an Ar pressure of 5 mTorr. Cr underlayers were deposited both at 25 degrees C and at 350 degrees C and exhibited different textures. Layer thicknesses were evaluated using Rutherford backscattering spectroscopy, while SmCo grain size and underlayer texture were determined from a Rietveld analysis of x-ray diffraction data. The magnetic properties were measured with a vibrating sample magnetometer. The resulting films had in-plane coercivities in the range 4-8 kOe. For a SmCo layer with a thickness of 200 nm, the Cr underlayer thickness was varied in the range 75-300 nm to study its effect on intergranular coupling in the films. For thermally demagnetized samples, both magnetizing and demagnetizing remanence curves were measured and used to evaluate switching field distributions and delta m plots. The underlayer texture was found to affect magnetic properties more strongly than underlayer thickness. (C) 2000 American Institute of Physics. [S0021-8979(00)84808-2].