High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis

被引:33
|
作者
Reolon, D. [1 ]
Jacquot, M. [1 ]
Verrier, I. [1 ]
Brun, G. [1 ]
Veillas, C. [1 ]
机构
[1] Univ St Etienne, Lab Hubert Curien, CNRS, UMR 5516, F-42000 St Etienne, France
来源
OPTICS EXPRESS | 2006年 / 14卷 / 26期
关键词
D O I
10.1364/OE.14.012744
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper we propose group refractive index measurement with a spectral interferometric set-up using a broadband supercontinuum generated in an air-silica Microstructured Optical Fibre (MOF) pumped with a picosecond pulsed microchip laser. This source authorizes high fringes visibility for dispersion measurements by Spectroscopic Analysis of White Light Interferograms (SAWLI). Phase calculation is assumed by a wavelet transform procedure combined with a curve fit of the recorded channelled spectrum intensity. This approach provides high resolution and absolute group refractive index measurements along one line of the sample by recording a single 2D spectral interferogram without mechanical scanning. (C) 2006 Optical Society of America.
引用
收藏
页码:12744 / 12750
页数:7
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