Near-field FTIR imaging: A technique for enhancing spatial resolution in FTIR microscopy

被引：0
|
作者：
Sahlin, JJ
Peppas, NA
机构：
[1] Purdue Univ, West Lafayette, United States
来源：
JOURNAL OF APPLIED POLYMER SCIENCE | 1997年 / 63卷 / 01期
关键词：
D O I：
10.1002/(SICI)1097-4628(19970103)63:1<103::AID-APP10>3.0.CO;2-6
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
Fourier transform infrared (FTIR) microscopy is a powerful analytical technique for characterization of polymeric materials. In certain applications, however, it would be advantageous to obtain higher spatial resolution than what is presently feasible. This contribution reviews the key principles of FTIR microscopy and presents a design enhancement that increases the spatial resolution that may be obtained with a standard FTIR microscope. Representative results are shown, which illustrate the technique's effectiveness. (C) 1997 John Wiley & Sons.
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页码：103 / 110
页数：8
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