Perpendicular magnetic anisotropy of CoFeB\Ta bilayers on ALD HfO2

Perpendicular magnetic anisotropy (PMA) is an essential condition for CoFe thin films used in magnetic random access memories. Until recently, interfacial PMA was mainly known to occur in materials stacks with MgO\CoFe(B) interfaces or using an adjacent crystalline heavy metal film. Here, PMA is reported in a CoFeB\Ta bilayer deposited on amorphous high-kappa dielectric (relative permittivity kappa=20) HfO2, grown by atomic layer deposition (ALD). PMA with interfacial anisotropy energy K-i up to 0.49 mJ/m(2) appears after annealing the stacks between 200 degrees C and 350 degrees C, as shown with vibrating sample magnetometry. Transmission electron microscopy shows that the decrease of PMA starting from 350 degrees C coincides with the onset of interdiffusion in the materials. High-kappa dielectrics are potential enablers for giant voltage control of magnetic anisotropy (VCMA). The absence of VCMA in these experiments is ascribed to a 0.6 nm thick magnetic dead layer between HfO2 and CoFeB. The results show PMA can be easily obtained on ALD high-kappa dielectrics. (C) 2017 Author(s).