Selective area growth of GaN nanowires on Si(111) substrate with Ti masks by molecular beam epitaxy

被引:6
|
作者
Li, Gang [1 ]
Yao, Yangyi [1 ]
Dagenais, Mario [1 ]
机构
[1] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA
基金
美国国家科学基金会;
关键词
GaN nanowires; Selective area growth; Molecular beam epitaxy; InGaN quantum dot; LIGHT-EMITTING-DIODES; NANOCOLUMNS; BLUE;
D O I
10.1016/j.jcrysgro.2019.125181
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We present results on the selective area growth (SAG) of Gallium Nitride (GaN) nanowires on Si substrate without any buffer layer by radio frequency plasma-assisted molecular beam epitaxy. Full selectivity was achieved with a thin Ti metal film used as a mask. The mask was fabricated with a lift-off method to avoid damage to the mask or Si substrate. The growth on the Ti film was totally suppressed at a low substrate temperature of 840 degrees C which is by far the lowest critical temperature for SAG. An InGaN thin layer was embedded in the GaN nanowires to realize a site controllable single photon source. Transmission electron microscopy (TEM) indicates single crystalline quality of defect-free GaN nanowires and the embedded InGaN quantum dot structure.
引用
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页数:5
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