Misalignments Characterization for Micro-CPV Modules

被引：3
|
作者：
San Jose, Luis [1 ]
Vallerotto, Guido [1 ]
Herrero, Rebeca [1 ]
Anton, Ignacio [1 ]
机构：
[1] Univ Politecn Madrid, Inst Solar Energy, Avda Complutense 30, E-28040 Madrid, Spain
来源：
16TH INTERNATIONAL CONFERENCE ON CONCENTRATOR PHOTOVOLTAIC SYSTEMS (CPV-16) | 2020年 / 2298卷
基金：
欧盟地平线“2020”;
关键词：
D O I：
10.1063/5.0032292
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
A validated method for misalignments characterization through image acquisition has been adapted for measuring misalignments in micro-CPV modules with integrated tracking. Due to the tight mechanical tolerances and tiny optical elements in this type of technology, a robust image processing that reduces the detection uncertainty of the optical components position in the image is required in order to obtain a valid measurement. An image processing based on pattern recognition is presented with promising results in the accuracy of the detection.
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页数：6
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