Aperture sampling requirements in planar near-field and pattern calculations

被引：0
|
作者：
Milligan, T
机构：
来源：
IEEE ANTENNAS AND PROPAGATION MAGAZINE | 1996年 / 38卷 / 05期
关键词：
D O I：
10.1109/74.544401
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Aperture sampling requirements in planar near-field and pattern calculations are presented. There are two types of sampling, the uniform and equiangular triangle sampling. In uniform sampling, equally spaced points for the integration of the aperture fields during the analysis of the antennas are used, while in equiangular triangle sampling larger spaced points are employed. Aperture sampling expression between planar near field and pattern calculation is the same. This calculation can be obtained easier by using the reduced nomograph expressions.
引用
收藏
页码：60 / 61
页数：2
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