A method for reconstructing label images from a few projections, as motivated by electron microscopy

被引：3
|
作者：
Liao, Hstau Y.
Herman, Gabor T.
机构：
[1] Univ Minnesota, Inst Math & Applicat, Minneapolis, MN 55455 USA
[2] CUNY, Dept Comp Sci, Discrete Imaging & Graph Grp, New York, NY USA
来源：
ANNALS OF OPERATIONS RESEARCH | 2006年 / 148卷 / 01期
基金：
美国国家科学基金会; 美国国家卫生研究院;
关键词：
electron tomography; electron microscopy; Gibbs distribution; few projections; global optimization; simulated annealing;
D O I：
10.1007/s10479-006-0081-0
中图分类号：
C93 [管理学]; O22 [运筹学];
学科分类号：
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要：
Our aim is to produce a tessellation of space into small voxels and, based on only a few tomographic projections of an object, assign to each voxel a label that indicates one of the components of interest constituting the object. Traditional methods are not reliable in applications, such as electron microscopy in which (due to the damage by radiation) only a few projections are available. We postulate a low level prior knowledge regarding the underlying distribution of label images, and then directly estimate the label image based on the prior and the projections. We use a relatively efficient approximation to a global search for the optimal estimate.
引用
收藏
页码：117 / 132
页数：16
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