Improving the Accuracy of Automated GUI Testing for Embedded Systems

被引：19

作者：

Lin, Ying-Dar ^{[1
,2
,3
]}

Chu, Edward T. -H. ^{[4
]}

Yu, Shang-Che ^{[5
]}

Lai, Yuan-Cheng ^{[6
]}

机构：

[1] NCTU, Dept Comp Sci, Hsinchu, Taiwan

[2] NCTU, Embedded Benchmarking Lab, Hsinchu, Taiwan

[3] NCTU, Networking Benchmarking Lab, Hsinchu, Taiwan

[4] Natl Yunlin Univ Sci & Technol, Dept Comp Sci & Informat Engn, Touliu, Taiwan

[5] NCTU, Hsinchu, Taiwan

[6] Natl Taiwan Univ Sci & Technol, Dept Informat Management, Taipei, Taiwan

来源：

IEEE SOFTWARE | 2014年 / 31卷 / 01期

关键词：

D O I：

10.1109/MS.2013.100

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

Automated GUIs test application user interfaces and verify their functionalities. However, due to the uncertainty of runtime execution environments, the device under test (DUT) might not reproduce GUI operations on time, resulting in test failures. The Smart Phone Automated GUI (SPAG) avoids nondeterministic events by batching event sequences and directly reproducing them on the DUT. SPAG dynamically changes the timing of following operations so that all event sequences can be performed on time. Experiments conducted on an Acer Liquid smartphone comparing SPAG to MonkeyRunner showed that SPAG can maintain up to 99.5 percent accuracy. © 1984-2012 IEEE.

引用

页码：39 / 45

页数：7

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