共 50 条
- [1] THICKNESS MEASUREMENT OF SILICON FILMS USING 14 MEV NEUTRONS JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-LETTERS, 1986, 104 (01): : 1 - 6
- [2] MEASUREMENT OF BACKWARD SCATTERING OF 14 MEV NEUTRONS NUCLEAR INSTRUMENTS & METHODS, 1970, 87 (02): : 291 - &
- [4] NEUTRON MULTIPLICATION MEASUREMENT IN BEO FOR 14-MEV NEUTRONS FUSION TECHNOLOGY, 1984, 6 (01): : 93 - 96
- [5] RADIATION DEFECTS IN SILICON AFTER IRRADIATION WITH 14 MEV NEUTRONS AND ANNEALING SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (06): : 778 - 779
- [6] A FAST IDENTIFICATION OF TRACES OF SILICON BY ACTIVATION ANALYSIS WITH 14 MEV NEUTRONS NUCLEAR INSTRUMENTS & METHODS, 1967, 49 (02): : 352 - &
- [7] DETERMINATION OF SILICON IN MAGNESITE SAMPLES BY MEANS OF 14-MEV NEUTRONS SILIKATY, 1980, 24 (01): : 91 - 95
- [8] DISTRIBUTION IN ENERGY OF THE NEUTRONS FROM THE INTERACTION OF 14-MEV NEUTRONS WITH SOME ELEMENTS PHYSICAL REVIEW, 1953, 89 (02): : 343 - 348
- [10] AN EXPERIMENTAL MEASUREMENT OF HIGH ENERGY GAMMA RAYS PRODUCED BY SLOWING DOWN OF 14 MEV NEUTRONS IN AIR HEALTH PHYSICS, 1970, 18 (04): : 339 - +