Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes - Comment

被引：2
|
作者：
Farley, AN
机构：
来源：
APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 26期
关键词：
D O I：
10.1063/1.119251
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：3618 / 3618
页数：1
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