Strengthened, biaxially textured Ni substrate with small alloying additions for coated conductor applications

被引：77

作者：

Goyal, A ^{[1
]}

Feenstra, R ^{[1
]}

Paranthaman, M ^{[1
]}

Thompson, JR ^{[1
]}

Kang, BY ^{[1
]}

Cantoni, C ^{[1
]}

Lee, DF ^{[1
]}

List, FA ^{[1
]}

Martin, PM ^{[1
]}

Lara-Curzio, E ^{[1
]}

Stevens, C ^{[1
]}

Kroeger, DM ^{[1
]}

Kowalewski, M ^{[1
]}

Specht, ED ^{[1
]}

Aytug, T ^{[1
]}

Sathyamurthy, S ^{[1
]}

Williams, RK ^{[1
]}

Ericson, RE ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2002年 / 382卷 / 2-3期

关键词：

D O I：

10.1016/S0921-4534(02)00626-3

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Fabrication of a biaxially textured, strengthened Ni substrate with small alloying additions of W and Fe is reported. The substrates have significantly improved mechanical properties compared to 99.99% Ni and surface characteristics which are similar to that of 99.99% Ni substrates. High quality oxide buffer layers can be deposited on these substrates without the need for any additional surface modification steps. Grain boundary misorientation distributions obtained from the substrate show a predominant fraction of low-angle grain boundaries. A high critical current density, J(c) of 1.9 MA/cm(2) at 77 K, self-field is demonstrated on this substrate using a multilayer configuration of YBCO/CeO2/YSZ/Y2O3/Ni-3at.%W-1.7at.%Fe. This translates to a I-c/width of 59 A/cm at 77 K and self-field. J(c) at 0.5 T is reduced by only 21% indicating strongly-linked grain boundaries in the YBCO film on this substrate. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：251 / 262

页数：12

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