Particle vs. Mode Entanglement in Optical Quantum Metrology

被引：0
|
作者：
Quesada, Nicolas [1 ]
Sahota, Jaspreet [1 ]
机构：
[1] Univ Toronto, McLennan Phys Labs, 60 St George St, Toronto, ON M5S 1A7, Canada
来源：
2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2015年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a constructive proof of the fact that mode entanglement is not necessary for optical quantum enhanced metrology (QEM) but particle entanglement is. We provide a particle entanglement witness that detects all path symmetric states useful for QEM in a Mach-Zender interferometer. (C) 2014 Optical Society of America
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页数：3
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