Concurrent test method for OTA-C filters

被引：12
|
作者：
Lee, KJ
Huang, KS
Wang, WC
机构：
[1] Faculty of Engineering, Mahanakorn University of Technology, Nong-Chok District, Bangkok 10530
[2] Dept. of Elec. and Electron. Eng., Imp. Coll. Sci., Technol. and Med., London SW7 2BT, Exhibition Road
来源：
ELECTRONICS LETTERS | 1997年 / 33卷 / 01期
关键词：
analogue circuits; operational transconductance; amplifiers;
D O I：
10.1049/el:19970045
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted From the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.
引用
收藏
页码：1 / 2
页数：2
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