Pattern matching for sets of segments

被引:0
|
作者
Efrat, A [1 ]
Indyk, P
Venkatasubramanian, S
机构
[1] Univ Arizona, Dept Comp Sci, Tucson, AZ 85721 USA
[2] Stanford Univ, Dept Comp Sci, Stanford, CA 94306 USA
[3] AT&T Labs Res, Florham Pk, NJ 07932 USA
关键词
pattern matching; orthogonal segments; maximum coverage; computational geometry;
D O I
10.1007/s00453-004-1089-y
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
In this paper we present algorithms for a number of problems in geometric pattern matching where the input consists of a collection of orthogonal segments in the plane. Such collections arise naturally from problems in mapping buildings and robot exploration. We propose a new criterion for segment similarity called the coverage measure, and present efficient algorithms for maximizing it between sets of axis-parallel segments under translations. In the general case, we present a procedure running in time O(n(3) log(2) n), and for the case when all segments are horizontal, we give a procedure that runs in time O(n(2) log(2) n). Here n is the number of segments. In addition, we show that an epsilon-approximation to the Hausdorff distance between two sets of horizontal segments under vertical translations can be computed in time O(n(3/2) max(poly(log M, logn, 1/epsilon))). Here, M denotes the ratio of the diameter to the closest pair of points in the sets of segments (where pairs of points lie on different segments). These algorithms are significant improvements over the general algorithm of Agarwal et a]. that required time O(n(4) log(2) n).
引用
收藏
页码:147 / 160
页数:14
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