Graphene in ohmic contact for both n-GaN and p-GaN

被引:23
|
作者
Zhong, Haijian [1 ]
Liu, Zhenghui [1 ]
Shi, Lin [1 ]
Xu, Gengzhao [1 ]
Fan, Yingmin [1 ]
Huang, Zengli [1 ]
Wang, Jianfeng [1 ,2 ]
Ren, Guoqiang [1 ,2 ]
Xu, Ke [1 ,2 ]
机构
[1] Chinese Acad Sci, Suzhou Inst Nanotech & Nanob, Suzhou 215123, Peoples R China
[2] Suzhou Nanowin Sci & Technol Co Ltd, Suzhou 215123, Peoples R China
基金
国家高技术研究发展计划(863计划);
关键词
Gallium nitride;
D O I
10.1063/1.4880732
中图分类号
O59 [应用物理学];
学科分类号
摘要
The wrinkles of single layer graphene contacted with either n-GaN or p-GaN were found both forming ohmic contacts investigated by conductive atomic force microscopy. The local I-V results show that some of the graphene wrinkles act as high-conductive channels and exhibiting ohmic behaviors compared with the flat regions with Schottky characteristics. We have studied the effects of the graphene wrinkles using density-functional-theory calculations. It is found that the standing and folded wrinkles with zigzag or armchair directions have a tendency to decrease or increase the local work function, respectively, pushing the local Fermi level towards n- or p-type GaN and thus improving the transport properties. These results can benefit recent topical researches and applications for graphene as electrode material integrated in various semiconductor devices. (C) 2014 AIP Publishing LLC.
引用
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页数:4
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