Effect of radiation on the characteristics of MIS structures containing rare-earth oxides

The results of experimental studies of the effect of gamma-irradiation on the electrical properties of MIS structures containing the rare-earth oxides Y2O3, Dy2O3, Tb2O3, Gd2O3, and Lu2O3 are reported. The static characteristics (current-voltage, capacitance-voltage) and dynamic characteristics (transient characteristics, diagrams of oscillatory regimes) of the structures before and after irradiation with doses D=10(4)-10(6) rad are examined. It is found that the irradiation dose D=10(6) rad does not produce any substantial degradation of the characteristics of the structures. The radiation-induced changes observed in the experimental samples are consistent with existing data for MIS structures with SiO2 as the insulator. (C) 1997 American Institute of Physics.