Domain structures and magnetization processes in thin Co films with in-plane anisotropy

被引:0
|
作者
Jaworowicz, J.
Kurant, Z.
Postava, K.
Maziewski, A.
Baczewski, L. T.
Wawro, A.
机构
[1] Univ Bialystok, Inst Expt Phys, PL-15424 Bialystok, Poland
[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[3] Tech Univ Ostrava, Dept Phys, Ostrava 70833, Czech Republic
来源
MATERIALS SCIENCE-POLAND | 2006年 / 24卷 / 03期
关键词
magnetization reversal; domain structure; Kerr effect; magneto-optic vector magnetometry;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetization reversal and domain structures in thin Co films in the thickness range 2 < d < 100 nm with in-plane magnetic anisotropy were studied. Both magneto-optical (MO) vector magnetometry and MO microscopy were used. A crossover of in-plane anisotropy symmetry from two-fold to six-fold was observed with increasing thickness of the Co layer from 2 nm to 100 nm. The evolution of the domain structure during magnetization reversal was studied for various orientations of the magnetic field relative to the anisotropy easy axis using a longitudinal Kerr MO microscope.
引用
收藏
页码:639 / 642
页数:4
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