共 50 条
- [1] Shear banding in polyamide 6 films as revealed by atomic force microscopy [J]. POLYMER, 2000, 41 (04) : 1561 - 1569
- [3] True atomic resolution imaging on semiconductor surfaces with noncontact atomic force microscopy [J]. DEFECTS IN ELECTRONIC MATERIALS II, 1997, 442 : 15 - 23
- [8] Atomic force microscopy of metallic surfaces [J]. ADVANCED MATERIALS & PROCESSES, 1999, 155 (02): : 35 - 37
- [9] ATOMIC FORCE MICROSCOPY OF MOLECULES ON SURFACES [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 202 : 153 - PHYS