The use of atomic force microscopy for imaging the surfaces of polyamide, 6

被引:0
|
作者
Tusek, L
Strnad, S
Stana-Kleinschek, K
Ribitsch, V
Werner, C
机构
[1] Univ Maribor, SI-2000 Maribor, Slovenia
[2] Graz Univ, A-8010 Graz, Austria
[3] Polymer Res Inst, D-01069 Dresden, Germany
关键词
D O I
10.1002/1521-3900(200205)181:1<467::AID-MASY467>3.0.CO;2-3
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The surface morphologies of PA 6 resulting from the use of various processing methods were studied by tapping mode atomic force microscopy. Three PA 6 samples: (1) a thin film, spin coated on a silicon wafer, (2) a freestanding film, i.e. a foil and (3) a monofilament, show definite morphological differences revealing typical supramolecular structures, The thin film having thickness of app. 35 nm is a good example of the initial step of spherulite formation where the sheaf development is still prominent. In an area of 100 mum(2) 1-4 spherulites can be detected which are typical of crystallization from the solution. The annealing (vacuum, 195degreesC, 3.5h) causes additional crystallization, which leads to a radial coordination and enlargement of spherulites to app. 50% in diameter and up to 40% in height. The morphology of foil (thickness of 100 mum) can be interpreted as a system of spherulites formed from the melt, and a typical fibrillar structure is observed on the surface of monofilament.
引用
收藏
页码:467 / 478
页数:12
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