Surface Partial Discharges Aging on Thin Polymeric Nanocomposite Films

被引:0
|
作者
Guastavino, F. [1 ]
Ratto, A. [1 ]
Della Giovanna, L. [1 ]
Gomez-Elvira, J. M. [2 ]
Garcia, N. [2 ]
机构
[1] Univ Genoa, Dynatech Dept, Genoa, Italy
[2] ICTP CSIC, Madrid, Spain
关键词
accelerate aging; nanocomposites; partial discharges; syndiotactic polypropylene; surface discharges; insulation; POLYAMIDE NANOCOMPOSITES; DEGRADATION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The following study evidences the effects of surface partial discharges aging on thin polymeric films in specific ambient conditions. The study has been performed on syndiotactic polypropylene and its nanocomposites. The specimens have been prepared by adding two different nanofillers to the pure polymer: montmorillonite and sepiolite, which are both silicate clays. In order to obtain a good dispersion of the considered nanofillers inside the matrix, the nanostructured materials have been prepared by extrusion. The nanofiller dispersion has been analyzed by means of a scanning electron microscope. Electrical breakdown strength measurements have been performed and surface partial discharges aging tests have been carried out inside an environmental chamber in order to control both the relative humidity level and the temperature. The specimens breakdown condition has been chosen as end point criterion and the concerning times to breakdown have been collected and compared in order to evidence the different behavior among the pure polymer and its nanocomposites.
引用
收藏
页码:1836 / 1840
页数:5
相关论文
共 50 条
  • [1] Surface modification of polymeric nanocomposite thin films.
    Balazs, AC
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U540 - U540
  • [2] ELECTRICAL AGING OF POLYMERIC DIELECTRICS IN CONDITIONS OF DEPRESSION OF PARTIAL DISCHARGES
    BEREZHANSKII, VB
    BYKOV, VM
    GORODOV, VV
    ZAKREVSKII, VA
    SLUTSKER, AI
    [J]. VYSOKOMOLEKULYARNYE SOEDINENIYA SERIYA A, 1986, 28 (10): : 2163 - 2169
  • [3] Surface modification of polymeric nanocomposite thin films using supercritical carbon dioxide
    Koga, T
    Li, C
    Sun, Y
    Brazin, A
    Rafailovich, MH
    Sokolov, JC
    Douglas, JF
    Mahajan, D
    [J]. TOPICS IN CATALYSIS, 2005, 32 (3-4) : 257 - 262
  • [4] Surface modification of polymeric nanocomposite thin films using supercritical carbon dioxide
    Tadanori Koga
    C. Li
    Y. Sun
    A. Brazin
    M. H. Rafailovich
    J. C. Sokolov
    J. F. Douglas
    D. Mahajan
    [J]. Topics in Catalysis, 2005, 32 : 257 - 262
  • [5] Surface change of polyamide nanocomposite caused by partial discharges
    Kozako, M
    Fuse, N
    Shibata, K
    Hirai, N
    Ohki, Y
    Okamoto, T
    Tanaka, T
    [J]. 2003 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 2003, : 75 - 78
  • [6] Plasma surface modification and characterization of POSS-based nanocomposite polymeric thin films
    Augustine, Brian H.
    Hughes, Wm. Christopher
    Zimmermann, Kathryn J.
    Figueiredo, Ashley J.
    Guo, Xiaowen
    Chusuei, Charles C.
    Maidment, Jessica S.
    [J]. LANGMUIR, 2007, 23 (08) : 4346 - 4350
  • [7] INFLUENCE OF ADDITIVES ON THE AGING OF PP FILMS CAUSED BY PARTIAL DISCHARGES
    SAID, S
    GOSSE, B
    GOSSE, JP
    [J]. PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, 1989, : 461 - 463
  • [8] BREAKDOWN OF THIN POLYTHENE FILMS BY SURFACE DISCHARGES
    SHIVKUMAR, B
    NEMA, RS
    [J]. INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1974, 12 (02) : 163 - 165
  • [9] Surface roughness evolution of nanocomposite thin films
    Turkin, A. A.
    Pei, Y. T.
    Shaha, K. P.
    Chen, C. Q.
    Vainshtein, D. I.
    De Hosson, J. Th. M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 105 (01)
  • [10] Plasma surface modification and characterization of POSS-based nanocomposite polymeric thin films for microfluidic devices
    Augustine, Brian H.
    Hughes, Wm Christopher
    Zimmerman, Katherine A.
    Maidment, Jessica S.
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 230 : U4278 - U4278