Corner cube model for internal metrology system of Space Interferometer Mission (SIM)

被引：0
|
作者：
Wang, Xu [1 ]
Korechoff, Robert [1 ]
Heflin, Mike [1 ]
Sievers, Lisa [1 ]
机构：
[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
ADVANCES IN STELLAR INTERFEROMETRY PTS 1 AND 2 | 2006年 / 6268卷
基金：
美国国家航空航天局;
关键词：
corner cube; laser metrology; picometer metrology; and interferometer;
D O I：
10.1117/12.670105
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.
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页数：10
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