AN EXTENSION DESIGN BY APPLYING PATENT MAP ANALYSIS ON PRODUCT LIFE CYCLE

被引:0
|
作者
Lo, Chi-Hung [1 ]
机构
[1] Tunghai Univ, Dept Ind Design, Taichung 40704, Taiwan
来源
PAKISTAN JOURNAL OF STATISTICS | 2013年 / 29卷 / 05期
关键词
Patent map analysis; Product life cycle; Extension design;
D O I
暂无
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Accompanying the development of high-tech industries, the time required from the discoveries and inventions in science and to the application of technique is rapidly shortened. While the discoveries in science also drive the development of new technologies, the development of new techniques also makes new science research be able to be realized. This way it generated the so-called phenomenon of science and technique approaching closer and the resonance thus occurs. For the development of technical breakthroughs, enriching and strengthening researches which go deep into fundamentals has gradually become very important. Therefore patents already granted are utilized in this study to analyze and make patent maps. Techniques employed on the market at the moment or immature and developing techniques are analyzed. With the analysis by patent maps, this approach looks deep into the variation in product life cycle.
引用
收藏
页码:769 / 784
页数:16
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