Structural and optical characterization of ZnO thin films deposited by sol-gel method

被引：0
|
作者：
Singh, A. [1 ,2 ]
Kumar, A. [2 ]
Suri, N. [1 ]
Kumar, S. [3 ]
Kumar, M. [2 ]
Khanna, P. K. [1 ]
Kumar, D. [2 ]
机构：
[1] Cent Elect Engn Res Inst, CSIR, Hybrid Microcircuit Grp, Pilani 333031, Rajasthan, India
[2] Kurukshetra Univ, Dept Elect Sci, Kurukshetra 132119, Haryana, India
[3] Indian Inst Technol, Nanosci & Nanotechnol Unit, Kanpur 208016, Uttar Pradesh, India
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2009年 / 11卷 / 06期
关键词：
Raman spectroscopy; Sol-gel; Zinc oxide; DOPED ZNO; SENSOR; AL;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Zinc oxide is a promising semiconductor material with a variety of applications. Transparent, highly crystalline and crack-free film was deposited on corning glass. A transparent sol of 0.33 mol/l was prepared by dissolving Zinc acetate dihydrate in 2-methoxyethanol using mono-ethanolamine as sol stabilizer. Addition of few drops of water turns the sol immediately into milky gel form. The film was annealed in oxygen environment at 500 degrees C for one hour and characterized by X-ray diffraction, Atomic force microscopy, UV-VIS spectroscopy and Raman spectroscopy. Thickness and roughness was measured by Surface profiler.
引用
收藏
页码：790 / 793
页数：4
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