Time-Critical Systems Design, Part II

被引：0

作者：

Henkel, Jorg ^{[1
]}

机构：

[1] IEEE Design&Test, Piscataway, NJ 08854 USA

来源：

IEEE DESIGN & TEST | 2018年 / 35卷 / 04期

关键词：

D O I：

10.1109/MDAT.2018.2847901

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：4 / 4

页数：1

共 50 条

[1] Guest Editors' Introduction: Special Issue on Time-Critical Systems Design Part II
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[J]. IEEE DESIGN & TEST, 2018, 35 (04) : 5 - 6
[2] Time-Critical Systems Design
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[J]. IEEE DESIGN & TEST, 2018, 35 (02) : 4 - 4
[3] Time-Critical Systems Design: A Survey
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[J]. IEEE DESIGN & TEST, 2018, 35 (02) : 8 - 26
[4] THE DESIGN OF TIME-CRITICAL CONVERSATIONS
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[J]. MICROPROCESSING AND MICROPROGRAMMING, 1993, 38 (1-5): : 785 - 792
[5] Robust control for time-critical systems
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Aygalinc, P
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[J]. ETFA 2001: 8TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 1, PROCEEDINGS, 2001, : 537 - 546
[6] Towards the control of time-critical systems
Bonhomme, P
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[J]. PROCEEDINGS OF THE 2001 IEEE INTERNATIONAL CONFERENCE ON CONTROL APPLICATIONS (CCA'01), 2001, : 1184 - 1189
[7] Guest Editors' Introduction: Special Issue on Time-Critical Systems Design
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[J]. IEEE DESIGN & TEST, 2018, 35 (02) : 5 - 7
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[10] USING SELECTIVE MEMORY PERFORMANCE EVALUATION FOR TIME-CRITICAL EMBEDDED SYSTEMS DESIGN
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