Random telegraph noise in metallic single-walled carbon nanotubes

被引：2

作者：

Chung, Hyun-Jong ^{[1
]}

Uhm, Tae Woo ^{[1
]}

Kim, Sung Won ^{[1
]}

You, Young Gyu ^{[1
]}

Lee, Sang Wook ^{[1
]}

Jhang, Sung Ho ^{[1
]}

Campbell, Eleanor E. B. ^{[1
,2
]}

Park, Yung Woo ^{[3
]}

机构：

[1] Konkuk Univ, Sch Phys, Div Quantum Phases & Devices, Seoul 143701, South Korea

[2] Univ Edinburgh, Sch Chem, EaStCHEM, Edinburgh EH9 3JJ, Midlothian, Scotland

[3] Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea

来源：

APPLIED PHYSICS LETTERS | 2014年 / 104卷 / 19期

关键词：

1/F NOISE; TRANSPORT;

D O I：

10.1063/1.4876443

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, tau(high) and tau(low), have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs. (C) 2014 AIP Publishing LLC.

引用

页数：4

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