Polymorphic phases of an organic semiconductor: a combined raman and grazing incidence X-ray diffraction study

被引：0
|
作者：
Jones, Andrew O. F. [1 ,2 ]
Schrode, Benedikt [1 ]
Sferrazza, Michele [2 ]
Resel, Roland [1 ]
机构：
[1] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria
[2] Univ Libre Bruxelles, Fac Sci, Dept Phys, B-1050 Brussels, Belgium
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2015年 / 71卷
关键词：
Organic semiconductors; thin films; polymorphism; substrate-induced phase;
D O I：
10.1107/S2053273315092384
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS43-P4
引用
收藏
页码：S515 / S515
页数：1
相关论文
共 50 条
  • [1] Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor
    Droege, Stefan
    Al Khalifah, Manea S.
    O'Neill, Mary
    Thomas, Huw E.
    Simmonds, Henje S.
    Macdonald, J. Emyr
    Aldred, Matthew P.
    Vlachos, Panos
    Kitney, Stuart P.
    Loebbert, Andreas
    Kelly, Stephen M.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2009, 113 (01): : 49 - 53
  • [2] Grazing incidence X-ray diffraction
    Dutta, P
    CURRENT SCIENCE, 2000, 78 (12): : 1478 - 1483
  • [3] Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
    Pietsch, U
    CURRENT SCIENCE, 2000, 78 (12): : 1484 - 1495
  • [4] X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments
    Neuhold, A.
    Novak, J.
    Flesch, H. -G.
    Moser, A.
    Djuric, T.
    Grodd, L.
    Grigorian, S.
    Pietsch, U.
    Resel, R.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 284 : 64 - 68
  • [5] Grazing incidence X-ray diffraction study on carbon nanowalls
    Yoshimura, Hirofumi
    Yamada, Shigeki
    Yoshimura, Akihiko
    Hirosawa, Ichiro
    Kojima, Kenichi
    Tachibana, Masaru
    CHEMICAL PHYSICS LETTERS, 2009, 482 (1-3) : 125 - 128
  • [6] Grazing incidence X-ray diffraction for the study of polycrystalline layers
    Simeone, David
    Baldinozzi, Gianguido
    Gosset, Dominique
    Le Caer, Sophie
    Berar, Jean-Francois
    THIN SOLID FILMS, 2013, 530 : 9 - 13
  • [7] Grazing incidence X-ray scattering and diffraction
    Basu J.K.
    Resonance, 2014, 19 (12) : 1158 - 1176
  • [8] Direct observation of liquid crystal phases under nanoconfinement: A grazing incidence X-ray diffraction study
    Ryu, Seong Ho
    Ahn, Hyungju
    Shin, Tae Joo
    Yoon, Dong Ki
    LIQUID CRYSTALS, 2017, 44 (04) : 713 - 721
  • [9] Characterization of lateral semiconductor nanostructures by means of x-ray grazing-incidence diffraction
    Paschke, K
    Geue, T
    Barberka, TA
    Bolm, A
    Pietsch, U
    Rosch, M
    Batke, E
    Faller, F
    Kerkel, K
    Oshinowo, J
    Forchel, A
    APPLIED PHYSICS LETTERS, 1997, 70 (08) : 1031 - 1033
  • [10] Grazing incidence X-ray diffraction study of the InAs/GaAs interface
    Rhan, H
    PHYSICA B, 1996, 221 (1-4): : 226 - 229
12345