Combining Time and Concurrency in Model-Based Statistical Testing of Embedded Real-Time Systems

被引：1

作者：

Homm, Daniel ^{[1
]}

Eckert, Juergen ^{[1
]}

German, Reinhard ^{[1
]}

机构：

[1] Univ Erlangen Nurnberg, Dept Comp Sci 7, Martensstr 3, D-91058 Erlangen, Germany

来源：

SOFTWARE ENGINEERING AND FORMAL METHODS (SEFM 2015) | 2015年 / 9509卷

关键词：

System testing; Timed usage models; Concurrency;

D O I：

10.1007/978-3-662-49224-6_3

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Timed usage models (TUMs) represent a model-based statistical approach for system testing of real-time embedded systems. They enable an automatic test case generation and the calculation of parameters that aid the test process. However, a classical TUM only supports sequential uses of the system under test (SUT). It is not capable of dealing with concurrency, which is required for state of the art real-time embedded systems. Therefore, we introduce TUMs with parallel regions. They also allow automatic test case generation, which is carried out similarly to classical TUMs. But, the semi-Markov process (SMP) that is usually used for analysis is not suitable here. We apply Markov renewal theory and define an SMP with parallel regions, which is used to calculate parameters. We validated our analytical approach by simulations.

引用

页码：22 / 31

页数：10

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