Effect of Defects on Graphene Thermoelectric Properties

被引：0
|
作者：
Anno, Yuki [1 ]
Takei, Kuniharu [1 ]
Akita, Seiji [1 ]
Arie, Takayuki [1 ]
机构：
[1] Osaka Prefecture Univ, Dept Phys & Elect, Osaka, Japan
来源：
2016 COMPOUND SEMICONDUCTOR WEEK (CSW) INCLUDES 28TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE & RELATED MATERIALS (IPRM) & 43RD INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (ISCS) | 2016年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页数：1
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