A single-sided multilevel structure for silicon pressure transducers by ''masked-maskless'' etching technology

被引:1
|
作者
Yang, H
Ren, JJ
Bao, MH
Shen, SQ
机构
关键词
silicon; multilevel structure; pressure transducers; maskless etching;
D O I
10.1117/12.284479
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A novel singled-sided multilevel island-beam-diaphragm structure has been designed and fabricated for an extremely high sensitivity pressure transducers by using a novel anisotropic etching technology called masked-maskless anisotropic etching technology. The structure consists of two small islands for overrange protection, two shallow masses for stress concentration, three thin beams on a deep-etched thin diaphragm for piezoresistoss location. A prototype pressure transducer of 400 pa operation range and 0.6% nonlinearity has been tested.
引用
收藏
页码:185 / 188
页数:4
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