On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors

被引:0
|
作者
Karimi, Naghmeh [1 ]
Maniatakos, Michail [2 ]
Jas, Abhijit [3 ]
Makris, Yiorgos [4 ]
机构
[1] Univ Tehran, ECE Dept, Tehran 14174, Iran
[2] Yale Univ, EE Dept, New Haven, CT USA
[3] Intel Corp, Validat & Test Solut, Santa Clara, CA USA
[4] Yale Univ, EE & CS Dept, New Haven, CT USA
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中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We investigate the correlation between register transfer-level faults in the control logic of a modem microprocessor and their instruction-level impact on the execution flow of typical programs. Such information can prove immensely useful in accurately assessing and prioritizing faults with regards to their criticality, as well as commensurately allocating resources to enhance testability, diagnosability, manufacturability and reliability. To this end, we developed an extensive infrastructure which allows injection of stuck-at faults and transient errors of arbitrary starting point and duration, as well as cost-effective simulation and classification of their repercussions into various instruction-level error types. As a test vehicle for our study, we employ a superscalar dynamically-scheduled, out-of-order Alpha-like microprocessor on which we execute SPEC2000 integer benchmarks. Extensive experimentation with faults injected in control logic modules of this microprocessor reveals interesting trends and results, corroborating the utility of this simulation infrastructure and motivating its further development and application to various tasks related to robust design.
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页码:601 / +
页数:2
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