Electro-Magnetic Robustness of Integrated Circuits: from statement to prediction

被引：0
|
作者：
Ben Dhia, S. [1 ,2 ,3 ]
Boyer, A. [1 ,2 ,3 ]
机构：
[1] Univ Toulouse, CNRS, LAAS, Toulouse, France
[2] UPS, INSA, INP, ISAE, Toulouse, France
[3] UTM, LAAS, UT1, Toulouse, France
来源：
2013 9TH INTERNATIONAL WORKSHOP ON ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2013) | 2013年
关键词：
Integrated circuits; electromagnetic compatibility; reliability; robustness; accelerated aging; EMC modelling;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
EMRIC project, a new research activity mixing integrated circuits electromagnetic compatibility (EMC) and integrated circuits (ICs) reliability, provides methods and guidelines to circuits and equipment designers to ensure EMC during lifetime of their applications. In order to improve the ICs electromagnetic robustness (EMR) this project studies the effect of ICs ageing on electromagnetic emission and immunity to radio frequency interferences, clarifies the link between IC degradations and related EMC drifts and develops prediction models and propose "time insensitive" EMC protection structures.
引用
收藏
页码：208 / 213
页数：6
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